SensL at the IEEE NSS-MIC 2017

SensL at the 2017 IEEE NSS-MIC Conference

SensL recently attended the 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference as both an exhibitor and to present recent research.

The conference is a great way to meet up with users from the medical imaging, hazard and threat and HEP markets, and allows us to keep up with all of the latest developments in those areas.

SensL’s Carl Jackson presented a poster entitled “First Results from CMOS Integrated SPAD and SiPM” which can be downloaded from the link. This poster describes how SensL has developed an integrated CMOS plus SPAD process using dedicated layers for the SPAD and SiPM microcells, which allows one to retain high sensitivity for blue photons. This process can then be used to implement a variety of analog and digital circuitry, and some early test projects along with a new product, Pandion, are described.

One of the development projects described in the poster was presented in more detail in session N-08 Photodetectors I, entitled “Towards a fully digital state-of-the-art analog SiPM” by E.Charbon et al. Keep an eye out for the forthcoming paper!

2017-11-01T12:42:57+00:00 November 1st, 2017|News|